Next Events

Past Events

2018, March 11-16: DPG Spring Meeting

Mr. Chris Schwalb will be giving a talk on March 14th at the annual meeting of the DPG (Deutsche Physikalische Gesellschaft). In his presentation he will mainly focus on correlative in-situ characterization of 3D nanostructures by combining SEM and AFM.

 

Furthermore GETec Microscopy will also be present at the accompanying exhibition. Feel free to visit us there to learn more about GETec Microscopy and AFSEMTM. You can find us at the booth of LOT-QuantumDesign.

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2018, Feb. 22-23: GrapheneForUS conference

For the first time the international conference for graphene and 2D materials will take place between the 22nd and 23rd of February. New York will host the event focusing on the exchange and exploration of graphene-related developments in science and its commercial use.

Mr. Stefan Hummel will be representing GETec and giving a talk on the second day of the conference.

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Mr. Peter Ziger from the GETec Microscopy GmbH (Austria) is kindly invited from the Center for electron microscopy and microanalysis (CEMM), IJS to give a lecture on correlative SEM/AFM/EDX microscopy. The lecture will be held on Tuesday, October 24, at 3:00 p.m. in the Kolar lecture room at the Jo┼żef Stefan Institute, Jamova 39, Ljubljana, Slovenia.

 

Download abstract as PDF