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AFSEM® — AFM in-situ SEM

Two microscopes are better than one

GETec Microscopy offers innovative Atomic Force Microscopy solutions for seamless integration into existing host systems like Scanning Electron Microscopes. In partnership with our customers, we develop dedicated nano analysis tools based on pre-engineered modules.

AFSEM® is an AFM by GETec Microscopy, designed for integration into an SEM or Dualbeam (SEM/FIB) microscope. It’s open access design allows to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The complimentary image data of AFM and SEM enable unique characterization of your sample.

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Latest News

2019, December 1-6: MRS Fall Meeting in Boston

Meet GETec at the MRS fall meeting in Boston!   At 4:30 PM on December 3rd Chris Schwalb will be giving a talk on "In-Situ Correlative Analysis of Ion-Beam Treated Nanostructure by Combination of AFM and FIB". Find the Abstract here! Furthermore, please feel free to visit us at the booths of Angstrom Scientific and Quantum Design to learn more [...]

Visit us at Booth #822 at the Microscopy and Microanalysis Meeting on August 5-8, 2019 in Portland Oregon

We will offer Vendor Tutorials at Quantum Design's booth after the exhibition on August 5, 6, and 7. Correlative in-situ analysis of nanostructered materials using a combination of AFM, SEM and FIB. See our AFSEM solutions also at Angstrom Scientific's booth #1452.   Find out more...

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“Constantly, applications and challenges arise for which the AFSEM is not only practical, but essential. That starts with direct correlation of specific particles or structures and ends with vacuum conditions as prerequisite, such as thermal measurements. Furthermore, the AFSEM accelerates the work-flow and therefore increases the efficiency for many studies.”

Assistant Professor Dr. Harald Plank, University of Technology Graz

“What was really convincing to us is the huge versatility of this combination of an Atomic Force Microscope with our excellent optical microscope for our challenging materials and problems. We simply can use real life specimen without big preparation.”

DI Herfried Lammer, Wood K plus
olivia moser

“AFSEM® not only extends the resolution of our microscopes by an order of magnitude, it extends our measurement capabilities beyond topography concerning material composition.”

Dr. Olivia Moser, Wood K plus

“Thanks to the AFSEM we can now perform in situ investigations in our FIB microscope, which were not possible before. Especially the possibility to immediately control the result of your nanofabrication experiment is a real benefit!”

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