Chris Schwalb will be giving a talk on March 14th at the annual meeting of the DPG (Deutsche Physikalische Gesellschaft).
In his presentation he will mainly focus on correlative in-situ characterization of 3D nanostructures by combining SEM and AFM.
Furthermore GETec Microscopy will also be present at the accompanying exhibition. Feel free to visit us there to learn more about GETec Microscopy and AFSEM®. You can find us at the booth of LOTQuantumDesign.
