2018, October 10-12: 4th International CISCEM in Saarbrücken, Germany

2018, October 10-12: 4th International CISCEM in Saarbrücken, Germany

Meet GETec at the Conference on In-situ and Correlative Electron Microscopy.

On wednesday Chris Schwalb will be giving a talk about interactive correlative in-situ analysis on the nanoscale by combination of AFM and SEM.

Meet us there and let’s discuss your application!

2019-02-14T08:40:20+00:00November 27th, 2018|