Meet GETec at the 20th Conference on Solid State Analysis in Vienna next week! This year’s special focus will be on “New Surfaces and Functional Layers – Functionalizing and Analyzing”.
On tuesday at 11:35 GETec’s Chris Schwalb will be giving a presentation on In-Situ Correlative AFM/SEM/FIB analysis of FIB-treated samples.
Furthermore, we would be happy to welcome you at our booth.
