2019 June, 1-3: 20th Conference on Solid State Analysis in Vienna

2019 June, 1-3: 20th Conference on Solid State Analysis in Vienna

Meet GETec at the 20th Conference on Solid State Analysis in Vienna next week! This year’s special focus will be on “New Surfaces and Functional Layers – Functionalizing and Analyzing”.
On tuesday at 11:35 GETec’s Chris Schwalb will be giving a presentation on In-Situ Correlative AFM/SEM/FIB analysis of FIB-treated samples.
Furthermore, we would be happy to welcome you at our booth.

Find out more…

2019-06-24T07:11:02+00:00June 24th, 2019|