GETec will be present at the FIB SEM User Group Meeting 2019 between the 6th and 7th of May at George Washington University in Washington, DC. On May 7th at 9:15 am GETec’s Chris Schwalb will be giving a presentation on In-Situ Correlative AFM/SEM/FIB analysis of ion-beam treated samples. Please visit us at the Quantum Design booth to talk more in depth about AFSEM and how it can benefit your application!
2019, May 6th-7th: FIB SEM user group meeting at Washington, D.C.
Marion Wolff2019-04-30T12:40:53+00:00April 30th, 2019|