Meet GETec at the MRS fall meeting in Boston!
At 4:30 PM on December 3rd Chris Schwalb will be giving a talk on “In-Situ Correlative Analysis of Ion-Beam Treated Nanostructure by Combination of AFM and FIB”. Find the Abstract here!
Furthermore, please feel free to visit us at the booths of Angstrom Scientific and Quantum Design to learn more about our unique in-situ correlative AFM.
Since we would love to show you how AFSEM can benefit your application.