AFSEM® — AFM in-situ SEM

Two microscopes are better than one

GETec Microscopy offers innovative Atomic Force Microscopy solutions for seamless integration into existing host systems like Scanning Electron Microscopes. In partnership with our customers, we develop dedicated nano analysis tools based on pre-engineered modules.

AFSEM® is an AFM by GETec Microscopy, designed for integration into an SEM or Dualbeam (SEM/FIB) microscope. It’s open access design allows to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The complimentary image data of AFM and SEM enable unique characterization of your sample.

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Latest News

2019 August, 4-8: Microscopy and Microanalysis meeting in Portland

Meet GETec at the Microscopy and Microanalysis conference in Portland between the 4th and 8th of August. GETec's Stefan Hummel will be present to answer all the questions you might have about AFSEM. Make sure to visit us at the Qunatum Design booth to find out how our product can benefit your application!   Find out more...

2019 July, 2-5: 16th Meeting of the French Microscopy Society

GETec will be attending the 16th Meeting of the French Microscopy Society in Poitiers, France. GETec's Pinar Frank will be giving a talk on correlative in-situ analysis by combination of AFM, SEM, and FIB. In addition, it will be the perfect opportunity to learn more about the unique properties of AFSEM.   Find out more...

2019 June, 1-3: 20th Conference on Solid State Analysis in Vienna

Meet GETec at the 20th Conference on Solid State Analysis in Vienna next week! This year's special focus will be on "New Surfaces and Functional Layers – Functionalizing and Analyzing". On tuesday at 11:35 GETec's Chris Schwalb will be giving a presentation on In-Situ Correlative AFM/SEM/FIB analysis of FIB-treated samples. Furthermore, we would be happy to welcome you at our [...]



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