AFSEM® — AFM in-situ SEM
Two microscopes are better than one
GETec Microscopy offers innovative Atomic Force Microscopy solutions for seamless integration into existing host systems like Scanning Electron Microscopes. In partnership with our customers, we develop dedicated nano analysis tools based on pre-engineered modules.
AFSEM® is an AFM by GETec Microscopy, designed for integration into an SEM or Dualbeam (SEM/FIB) microscope. It’s open access design allows to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The complimentary image data of AFM and SEM enable unique characterization of your sample.
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Latest News
2019, December 1-6: MRS Fall Meeting in Boston
Meet GETec at the MRS fall meeting in Boston! At 4:30 PM on December 3rd Chris Schwalb will be giving a talk on "In-Situ Correlative Analysis of Ion-Beam Treated Nanostructure by Combination of AFM and FIB". Find the Abstract here! Furthermore, please feel free to visit us at the booths of Angstrom Scientific and Quantum Design to learn more [...]
2019, September 1-5: Microscopy Conference in Berlin
Visit us at the microscopy conference in Berlin, Germany! At the booth of Quantum Design Europe you can learn more about the AFSEM®. Moreover, we would like to show you how it can benefit your application. Read more...
Visit us at Booth #822 at the Microscopy and Microanalysis Meeting on August 5-8, 2019 in Portland Oregon
We will offer Vendor Tutorials at Quantum Design's booth after the exhibition on August 5, 6, and 7. Correlative in-situ analysis of nanostructered materials using a combination of AFM, SEM and FIB. See our AFSEM solutions also at Angstrom Scientific's booth #1452. Find out more...
Jürgen Schlütter becomes new CEO of GETec Microscopy
We are more than happy to announce that Jürgen Schlütter joins GETec Microscopy as our new CEO.
AFSEM® users about our product…
“Constantly, applications and challenges arise for which the AFSEM is not only practical, but essential. That starts with direct correlation of specific particles or structures and ends with vacuum conditions as prerequisite, such as thermal measurements. Furthermore, the AFSEM accelerates the work-flow and therefore increases the efficiency for many studies.”
“What was really convincing to us is the huge versatility of this combination of an Atomic Force Microscope with our excellent optical microscope for our challenging materials and problems. We simply can use real life specimen without big preparation.”
“AFSEM® not only extends the resolution of our microscopes by an order of magnitude, it extends our measurement capabilities beyond topography concerning material composition.”
“Thanks to the AFSEM we can now perform in situ investigations in our FIB microscope, which were not possible before. Especially the possibility to immediately control the result of your nanofabrication experiment is a real benefit!”
