AFSEM® — AFM in-situ SEM
Two microscopes are better than one
GETec Microscopy offers innovative Atomic Force Microscopy solutions for seamless integration into existing host systems like Scanning Electron Microscopes. In partnership with our customers, we develop dedicated nano analysis tools based on pre-engineered modules.
AFSEM® is an AFM by GETec Microscopy, designed for integration into an SEM or Dualbeam (SEM/FIB) microscope. It’s open access design allows to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The complimentary image data of AFM and SEM enable unique characterization of your sample.
What is your Application?
AFSEM® in Action
Latest News
2019, April 25th-26th: ASEM workshop in Graz, Austria
Meet GETec at the ASEM workshop. GETec's Chris Schwalb will be giving a talk on April 26th at 10am. The presentation wil be focusing on the topic of correlative in-situ analysis by combination of AFM, SEM and FIB. Furthermore we would be happy to use this opportunity to discuss with you, how such an analysis can benefit your application. Find [...]
2019, April 5th: Fysica 2019 in Amsterdam
Meet GETec at the Fysica on April 5th in Amsterdam. Visit the LOT Quantum Design booth to find out more about our unique correlative analysis platform. We will be more than happy to dicuss with you how it can benefit your application. More on the Fysica 2019!
2019, March: Article in Spectrum Magazine
The AFSEM® was featured in the march issue of Spectrum, a specialist journal published by Quantum Design LOT Germany. The second article in this series focuses on the use of AFSEM® for high resolution conductivity measurements Download Article...
2019, Feb.: 1st AFSEM® application video
Have you seen our first AFSEM® application video? In it we analyse a specific bone structure, called lacunae, and show you how this experiment benefits from the unique properties of AFSEM®.
