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2018, October 10-12: 4th International CISCEM in Saarbrücken, Germany

Meet GETec at the Conference on In-situ and Correlative Electron Microscopy.

On wednesday Chris Schwalb will be giving a talk about interactive correlative in-situ analysis on the nanoscale by combination of AFM and SEM.

Meet us there and let’s discuss your application!

2019-02-14T08:40:20+00:00November 27th, 2018|

2018, October 3-5: 26th International Conference on Materials and Technology in Portorož, SI

With AFSEM®, SEM and AFM can be combined to conduct a correlative, in situ analysis of a variety of different materials.

Visit us at our booth to find out how it can benefit your application.

 

 

2019-02-14T08:41:58+00:00September 27th, 2018|

2018, August 5-9: Microscopy & Microanalysis Meeting in Baltimore

GETec will be presenting various posters, which take a closer look at novel experiments, that can be conducted using the AFSEM®.

Furthermore we will be present at the booth of Quantum Design and would be happy to discuss with you, how AFSEM® can benefit your application.

Find out more…

2019-02-14T08:45:02+00:00June 27th, 2018|