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2019, March: Article in Spectrum Magazine

Spectrum, a specialist journal published by Quantum Design LOT Germany featured AFSEM® in the march issue.

The second article in this series focuses on the use of AFSEM® for high resolution conductivity measurements.

Until now, the limiting factor for this standard AFM measurement modes, has been the larger radius of the specially coated, conductive cantilever tips compared with normal, uncoated tips.

We have taken a new path by using self-sensing and conductive cantilevers which feature a different design.


Read Article (german version)

Read Article (english version)

2020-01-29T09:10:31+00:00February 28th, 2019|

2019, Feb.: 1st AFSEM® application video

Have you seen our first AFSEM® application video? In it we analyse a specific bone structure, called lacunae, and show you how this experiment benefits from the unique properties of AFSEM®.

2020-01-29T09:10:44+00:00February 4th, 2019|

2018, October 10-12: 4th International CISCEM in Saarbrücken, Germany

Meet GETec at the Conference on In-situ and Correlative Electron Microscopy.

On wednesday Chris Schwalb will be giving a talk about interactive correlative in-situ analysis on the nanoscale by combination of AFM and SEM.

Meet us there and let’s discuss your application!

2019-02-14T08:40:20+00:00November 27th, 2018|

2018, October 3-5: 26th International Conference on Materials and Technology in Portorož, SI

With AFSEM®, SEM and AFM can be combined to conduct a correlative, in situ analysis of a variety of different materials.

Visit us at our booth to find out how it can benefit your application.



2019-02-14T08:41:58+00:00September 27th, 2018|

2018, August 5-9: Microscopy & Microanalysis Meeting in Baltimore

GETec will be presenting various posters, which take a closer look at novel experiments, that can be conducted using the AFSEM®.

Furthermore we will be present at the booth of Quantum Design and would be happy to discuss with you, how AFSEM® can benefit your application.

Find out more…

2019-02-14T08:45:02+00:00June 27th, 2018|

2018, July 10-13: 7th FEBIP in Modena, Italy

The 7th International Workshop on Focused Electron Beam-Induced Processing, will be held in Modena
(Italy) from 10 to 13 of July 2018.

GETec is proud to be a gold sponsor at the FEBIP workshop in Modena.

Chris Schwalb will give a presentation on July 11th highlighting the AFSEM benefits for applications in
the field of focused electron beam-induced processing.

Let us meet you at our booth and discuss your application!

2019-02-11T15:24:15+00:00June 22nd, 2018|

2018, June 19-20: 2nd EuFN Workshop in Grenoble, France

This event is organized by the European FIB network and is expecting participants from all over Europe.
It is an opportunity to share knowledge and experience in the field of Focused Ion Beam.
GETec will be presenting the AFSEM® and the unique benefits it can provide for your FIB system.
Please visit us at our booth and learn more about our product!

Find out more about this event…

2019-02-14T07:36:19+00:00June 14th, 2018|

2018, June 11-13: HeFIB confernece in Dresden, Germany

Since two of its main focuses are on Helium Ion Microscopy and correlative nanoanalytics, GETec will be presenting its ground-breaking, in-situ AFM solution for the Zeiss ORION Nanofab.

It enables interactive correlative analysis of your sample within the ORION Nanofab, without limiting the other tools of the microscope, since it can be adjusted to your specific helium ion microscope and application.

Meet us there and let’s discuss your application!

Find out more…

2019-02-14T07:41:16+00:00June 2nd, 2018|