GETec will be attending the 16th Meeting of the French Microscopy Society in Poitiers, France. GETec’s Pinar Frank will be giving a talk on correlative in-situ analysis by combination of AFM, SEM, and FIB. In addition, it will be the perfect opportunity to learn more about the unique properties of AFSEM.
We proudly announce that we have joined forces with Quantum Design International.
“By joining forces, Quantum Design and GETec will significantly increase our combined footprint in the nanotechnology space. GETec’s leading Atomic Force Microscopy in SEM technology nicely complements Quantum Design’s strong position in materials property characterization instrumentation and optics,” stated Jerry Daviess, Chief Executive Officer for Quantum Design International.
“We here at GETec are very excited about the new opportunities available to us through this acquisition,” replied Dr. Ernest Fantner, CEO and Managing Director of GETec. “We look forward to working with Quantum Design on future endeavors. Their strong sales and support presence around the world in so many countries will allow our products to reach the scientists who would like to use them for their microscopy research.”
Furthermore, to highlight GETec’s affiliation with Quantum Design International a new logo has been released.
The 3oth edition of the Spectrum magazine by Quantum Design LOT feautures the AFSEM. The article focuses on In situ Magnetic Force Microscopy (MFM) analysis of nanostructues using our product.
Our partner Quantum Design UK and Ireland is hosting an AFM in-situ SEM seminar in Leatherhead, Surrey. GETec’s Ernest Fantner will be present to tell you more about our AFSEM, its unique applications and what it is that makes it stand out from the rest.
Furthermore, a live demo will take place, for you to see our product in action and its high ease of use.
Please register for the seminar via this link….
Meet GETec at the 3rd Workshop of the European FIB Network in Dresden.
Chris Schwalb and Stefan Hummel will be giving a presentation on in-situ correlative analysis of FIB-treated samples. Furthermore, feel more than free to ask any questions you might have regarding this novel analysis method and tool.
Meet GETec at the 20th Conference on Solid State Analysis in Vienna next week! This year’s special focus will be on “New Surfaces and Functional Layers – Functionalizing and Analyzing”.
On tuesday at 11:35 GETec’s Chris Schwalb will be giving a presentation on In-Situ Correlative AFM/SEM/FIB analysis of FIB-treated samples.
Furthermore, we would be happy to welcome you at our booth.
Meet GETec at the 3rd Slovene Microscopy Symposium in Ankaran, Slovenia.
Please visit us at our booth to learn more about AFSEM and to see how it can benefit your application!
GETec will be present at the FIB SEM User Group Meeting 2019 between the 6th and 7th of May at George Washington University in Washington, DC. On May 7th at 9:15 am GETec’s Chris Schwalb will be giving a presentation on In-Situ Correlative AFM/SEM/FIB analysis of ion-beam treated samples. Please visit us at the Quantum Design booth to talk more in depth about AFSEM and how it can benefit your application!
Meet GETec at the ASEM workshop.
GETec’s Chris Schwalb will be giving a talk on April 26th at 10am. The presentation wil be focusing on the topic of correlative in-situ analysis by combination of AFM, SEM and FIB.
Furthermore we would be happy to use this opportunity to discuss with you, how such an analysis can benefit your application.
