Register for our webinar on characterization of conductive and magnetic nanostructures by correlative in-situ AFM and SEM via the link below!
Make sure to check out the latest AFSEM paper! Its topic is coloration of a copper surface by nanostructuring with femtosecond laser pulses. The AFM measurements were performed with the AFSEM at USTEM in Vienna.
Have you read the latest AFSEM paper? It tells you all about how our AFSEM was integrated into a Helium Ion Microscopy and which interesting experiment was made possible by this unique setup.
Unfortunately this year’s ASEM workshop was cancelled. We hope that soon we will be able to tell you all about AFSEM and its unique applications in person, but for now please have a look at our webinar and many more interesting videos on our Youtube Channel.
Meet GETec at the MRS fall meeting in Boston!
At 4:30 PM on December 3rd Chris Schwalb will be giving a talk on “In-Situ Correlative Analysis of Ion-Beam Treated Nanostructure by Combination of AFM and FIB”. Find the Abstract here!
Furthermore, please feel free to visit us at the booths of Angstrom Scientific and Quantum Design to learn more about our unique in-situ correlative AFM.
Since we would love to show you how AFSEM can benefit your application.
Visit us at the microscopy conference in Berlin, Germany!
At the booth of Quantum Design Europe you can learn more about the AFSEM®. Moreover, we would like to show you how it can benefit your application.
Visit us at Booth #822 at the Microscopy and Microanalysis Meeting on August 5-8, 2019 in Portland Oregon
We will offer Vendor Tutorials at Quantum Design’s booth after the exhibition on August 5, 6, and 7.
Correlative in-situ analysis of nanostructered materials using a combination of AFM, SEM and FIB.
See our AFSEM solutions also at Angstrom Scientific’s booth #1452.
We are more than happy to announce that Jürgen Schlütter joins GETec Microscopy as our new CEO.
Meet GETec at the Microscopy and Microanalysis conference in Portland between the 4th and 8th of August. GETec’s Stefan Hummel will be present to answer all the questions you might have about AFSEM.
Make sure to visit us at the Qunatum Design booth to find out how our product can benefit your application!
GETec will be attending the 16th Meeting of the French Microscopy Society in Poitiers, France. GETec’s Pinar Frank will be giving a talk on correlative in-situ analysis by combination of AFM, SEM, and FIB. In addition, it will be the perfect opportunity to learn more about the unique properties of AFSEM.