The AFSEM® was featured in the march issue of Spectrum, a specialist journal published by Quantum Design LOT Germany.
The second article in this series focuses on the use of AFSEM® for high resolution conductivity measurements
Meet GETec at the Conference on In-situ and Correlative Electron Microscopy.
On wednesday Chris Schwalb will be giving a talk about interactive correlative in-situ analysis on the nanoscale by combination of AFM and SEM.
Meet us there and let’s discuss your application!
With AFSEM®, SEM and AFM can be combined to conduct a correlative, in situ analysis of a variety of different materials.
Visit us at our booth to find out how it can benefit your application.