News

2018, October 10-12: 4th International CISCEM in Saarbrücken, Germany

Meet GETec at the Conference on In-situ and Correlative Electron Microscopy.

On wednesday Chris Schwalb will be giving a talk about interactive correlative in-situ analysis on the nanoscale by combination of AFM and SEM.

Meet us there and let’s discuss your application!

2019-02-14T08:40:20+00:00November 27th, 2018|

2018, October 3-5: 26th International Conference on Materials and Technology in Portorož, SI

With AFSEM®, SEM and AFM can be combined to conduct a correlative, in situ analysis of a variety of different materials.

Visit us at our booth to find out how it can benefit your application.

 

 

2019-02-14T08:41:58+00:00September 27th, 2018|