We are more than happy to announce that Jürgen Schlütter joins GETec Microscopy as our new CEO.
Spectrum, a specialist journal published by Quantum Design LOT Germany featured AFSEM® in the march issue.
The second article in this series focuses on the use of AFSEM® for high resolution conductivity measurements.
Until now, the limiting factor for this standard AFM measurement modes, has been the larger radius of the specially coated, conductive cantilever tips compared with normal, uncoated tips.
We have taken a new path by using self-sensing and conductive cantilevers which feature a different design.
Meet GETec at the Conference on In-situ and Correlative Electron Microscopy.
On wednesday Chris Schwalb will be giving a talk about interactive correlative in-situ analysis on the nanoscale by combination of AFM and SEM.
Meet us there and let’s discuss your application!
With AFSEM®, SEM and AFM can be combined to conduct a correlative, in situ analysis of a variety of different materials.
Visit us at our booth to find out how it can benefit your application.