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Visit us at Booth #822 at the Microscopy and Microanalysis Meeting on August 5-8, 2019 in Portland Oregon

We will offer Vendor Tutorials at Quantum Design’s booth after the exhibition on August 5, 6, and 7.

Correlative in-situ analysis of nanostructered materials using a combination of AFM, SEM and FIB.

See our AFSEM solutions also at Angstrom Scientific’s booth #1452.

 

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2019-07-31T14:48:05+00:00July 31st, 2019|

2019 August, 4-8: Microscopy and Microanalysis meeting in Portland

Meet GETec at the Microscopy and Microanalysis conference in Portland between the 4th and 8th of August. GETec’s Stefan Hummel will be present to answer all the questions you might have about AFSEM.
Make sure to visit us at the Qunatum Design booth to find out how our product can benefit your application!

 

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2019-07-01T14:16:54+00:00July 1st, 2019|

2019 July, 2-5: 16th Meeting of the French Microscopy Society

GETec will be attending the 16th Meeting of the French Microscopy Society in Poitiers, France. GETec’s Pinar Frank will be giving a talk on correlative in-situ analysis by combination of AFM, SEM, and FIB. In addition, it will be the perfect opportunity to learn more about the unique properties of AFSEM.

 

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2019-06-27T14:03:55+00:00June 27th, 2019|

GETec Microscopy Acquisition by Quantum Design International

We proudly announce that we have joined forces with Quantum Design International.

“By joining forces, Quantum Design and GETec will significantly increase our combined footprint in the nanotechnology space. GETec’s leading Atomic Force Microscopy in SEM technology nicely complements Quantum Design’s strong position in materials property characterization instrumentation and optics,” stated Jerry Daviess, Chief Executive Officer for Quantum Design International.

“We here at GETec are very excited about the new opportunities available to us through this acquisition,” replied Dr. Ernest Fantner, CEO and Managing Director of GETec. “We look forward to working with Quantum Design on future endeavors. Their strong sales and support presence around the world in so many countries will allow our products to reach the scientists who would like to use them for their microscopy research.”

Furthermore, to highlight GETec’s affiliation with Quantum Design International a new logo has been released.

Read more…

 

2019-08-14T13:39:19+00:00June 18th, 2019|

2019 June 18th: AFM in-situ SEM seminar Leatherhead, Surrey

Our partner Quantum Design UK and Ireland is hosting an AFM in-situ SEM seminar in Leatherhead, Surrey. GETec’s Ernest Fantner will be present to tell you more about our AFSEM, its unique applications and what it is that makes it stand out from the rest.

Furthermore, a live demo will take place, for you to see our product in action and its high ease of use.

Please register for the seminar via this link….

 

2019-06-05T14:09:51+00:00June 5th, 2019|

2019 June 12th-14th: 3rd EuFN Workshop in Dresden

Meet GETec at the 3rd Workshop of the European FIB Network in Dresden.

Chris Schwalb and Stefan Hummel will be giving a presentation on in-situ correlative analysis of FIB-treated samples. Furthermore, feel more than free to ask any questions you might have regarding this novel analysis method and tool.

 

2019-06-05T13:51:47+00:00June 5th, 2019|

2019 July, 1-3: 20th Conference on Solid State Analysis in Vienna

Meet GETec at the 20th Conference on Solid State Analysis in Vienna next week! This year’s special focus will be on “New Surfaces and Functional Layers – Functionalizing and Analyzing”.
On tuesday at 11:35 GETec’s Chris Schwalb will be giving a presentation on In-Situ Correlative AFM/SEM/FIB analysis of FIB-treated samples.
Furthermore, we would be happy to welcome you at our booth.

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2019-08-14T13:51:52+00:00May 28th, 2019|

2019, May 6th-7th: FIB SEM user group meeting at Washington, D.C.

GETec will be present at the FIB SEM User Group Meeting 2019 between the 6th and 7th of May at George Washington University in Washington, DC. On May 7th at 9:15 am GETec’s Chris Schwalb will be giving a presentation on In-Situ Correlative AFM/SEM/FIB analysis of ion-beam treated samples. Please visit us at the Quantum Design booth to talk more in depth about AFSEM and how it can benefit your application!

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2019-04-30T12:40:53+00:00April 30th, 2019|