Meet GETec at the ASEM workshop.
GETec’s Chris Schwalb will be giving a talk on April 26th at 10am. The presentation wil be focusing on the topic of correlative in-situ analysis by combination of AFM, SEM and FIB.
Furthermore we would be happy to use this opportunity to discuss with you, how such an analysis can benefit your application.
Meet GETec at the Fysica on April 5th in Amsterdam. Visit the LOT Quantum Design booth to find out more about our unique correlative analysis platform.
We will be more than happy to dicuss with you how it can benefit your application.
The AFSEM® was featured in the march issue of Spectrum, a specialist journal published by Quantum Design LOT Germany.
The second article in this series focuses on the use of AFSEM® for high resolution conductivity measurements
Have you seen our first AFSEM® application video? In it we analyse a specific bone structure, called lacunae, and show you how this experiment benefits from the unique properties of AFSEM®.
The AFSEM® was featured in the september issue of Spectrum, a specialist journal published by Quantum Design LOT Germany.
The first article in this series introduces AFSEM® and gives a short overview of a selection of applications.
GETec will be presenting various posters, which take a closer look at novel experiments, that can be conducted using the AFSEM®.
Furthermore we will be present at the booth of Quantum Design and would be happy to discuss with you, how AFSEM® can benefit your application.
The 7th International Workshop on Focused Electron Beam-Induced Processing, will be held in Modena
(Italy) from 10 to 13 of July 2018.
GETec is proud to be a gold sponsor at the FEBIP workshop in Modena.
Chris Schwalb will give a presentation on July 11th highlighting the AFSEM benefits for applications in
the field of focused electron beam-induced processing.
Let us meet you at our booth and discuss your application!
This event is organized by the European FIB network and is expecting participants from all over Europe.
It is an opportunity to share knowledge and experience in the field of Focused Ion Beam.
GETec will be presenting the AFSEM® and the unique benefits it can provide for your FIB system.
Please visit us at our booth and learn more about our product!
Since two of its main focuses are on Helium Ion Microscopy and correlative nanoanalytics, GETec will be presenting its ground-breaking, in-situ AFM solution for the Zeiss ORION Nanofab.
It enables interactive correlative analysis of your sample within the ORION Nanofab, without limiting the other tools of the microscope, since it can be adjusted to your specific helium ion microscope and application.
Meet us there and let’s discuss your application!
The Christian Doppler laboratory for direct fabrication of 3D nano probes explores a new type of 3D nanoprinting technology. The goal of this research programme is to enable new applications in the field of in-situ atomic force microscopy.
GETec Microscopy acts as an industrial partner and will use the anticipated 3D nano probes to further improve their in-situ AFM systems.
