2019, April 25th-26th: ASEM workshop in Graz, Austria

Meet GETec at the ASEM workshop.
GETec’s Chris Schwalb will be giving a talk on April 26th at 10am. The presentation wil be focusing on the topic of correlative in-situ analysis by combination of AFM, SEM and FIB.
Furthermore we would be happy to use this opportunity to discuss with you, how such an analysis can benefit your application.

Find out more…

2019-04-30T12:41:20+00:00April 15th, 2019|

2019, March: Article in Spectrum Magazine

Spectrum, a specialist journal published by Quantum Design LOT Germany featured AFSEM® in the march issue.

The second article in this series focuses on the use of AFSEM® for high resolution conductivity measurements.

Until now, the limiting factor for this standard AFM measurement modes, has been the larger radius of the specially coated, conductive cantilever tips compared with normal, uncoated tips.

We have taken a new path by using self-sensing and conductive cantilevers which feature a different design.


Read Article (german version)

Read Article (english version)

2019-05-13T10:02:20+00:00February 28th, 2019|

2019, Feb.: 1st AFSEM® application video

Have you seen our first AFSEM® application video? In it we analyse a specific bone structure, called lacunae, and show you how this experiment benefits from the unique properties of AFSEM®.

2019-02-14T08:38:51+00:00February 4th, 2019|

2018, August 5-9: Microscopy & Microanalysis Meeting in Baltimore

GETec will be presenting various posters, which take a closer look at novel experiments, that can be conducted using the AFSEM®.

Furthermore we will be present at the booth of Quantum Design and would be happy to discuss with you, how AFSEM® can benefit your application.

Find out more…

2019-02-14T08:45:02+00:00June 27th, 2018|

2018, July 10-13: 7th FEBIP in Modena, Italy

The 7th International Workshop on Focused Electron Beam-Induced Processing, will be held in Modena
(Italy) from 10 to 13 of July 2018.

GETec is proud to be a gold sponsor at the FEBIP workshop in Modena.

Chris Schwalb will give a presentation on July 11th highlighting the AFSEM benefits for applications in
the field of focused electron beam-induced processing.

Let us meet you at our booth and discuss your application!

2019-02-11T15:24:15+00:00June 22nd, 2018|

2018, June 19-20: 2nd EuFN Workshop in Grenoble, France

This event is organized by the European FIB network and is expecting participants from all over Europe.
It is an opportunity to share knowledge and experience in the field of Focused Ion Beam.
GETec will be presenting the AFSEM® and the unique benefits it can provide for your FIB system.
Please visit us at our booth and learn more about our product!

Find out more about this event…

2019-02-14T07:36:19+00:00June 14th, 2018|

2018, June 11-13: HeFIB confernece in Dresden, Germany

Since two of its main focuses are on Helium Ion Microscopy and correlative nanoanalytics, GETec will be presenting its ground-breaking, in-situ AFM solution for the Zeiss ORION Nanofab.

It enables interactive correlative analysis of your sample within the ORION Nanofab, without limiting the other tools of the microscope, since it can be adjusted to your specific helium ion microscope and application.

Meet us there and let’s discuss your application!

Find out more…

2019-02-14T07:41:16+00:00June 2nd, 2018|

2018, April 26: Opening of the CD laboratory in Graz

The Christian Doppler laboratory for direct fabrication of 3D nano probes explores a new type of 3D nanoprinting technology. The goal of this research programme is to enable new applications in the field of in-situ atomic force microscopy.

GETec Microscopy acts as an industrial partner and will use the anticipated 3D nano probes to further improve their in-situ AFM systems.

2019-02-14T08:01:30+00:00April 4th, 2018|