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AFSEM® — AFM in-situ SEM

Two microscopes are better than one

GETec Microscopy offers innovative Atomic Force Microscopy solutions for seamless integration into existing host systems like Scanning Electron Microscopes. In partnership with our customers, we develop dedicated nano analysis tools based on pre-engineered modules.

AFSEM® is an AFM by GETec Microscopy, designed for integration into an SEM or Dualbeam (SEM/FIB) microscope. It’s open access design allows to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The complimentary image data of AFM and SEM enable unique characterization of your sample.

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Latest News

2018, August 5-9: Microscopy & Microanalysis Meeting in Baltimore

GETec will be presenting various posters, which take a closer look at novel experiments, that can be conducted using the AFSEM®. Furthermore we will be present at the booth of Quantum Design and would be happy to discuss with you, how AFSEM® can benefit your application. Find out more...

2018, July 10-13: 7th FEBIP in Modena, Italy

The 7th International Workshop on Focused Electron Beam-Induced Processing, will be held in Modena (Italy) from 10 to 13 of July 2018. GETec is proud to be a gold sponsor at the FEBIP workshop in Modena. Chris Schwalb will give a presentation on July 11th highlighting the AFSEM benefits for applications in the field of focused electron beam-induced processing. Let [...]

2018, June 19-20: 2nd EuFN Workshop in Grenoble, France

This event is organized by the European FIB network and is expecting participants from all over Europe. It is an opportunity to share knowledge and experience in the field of Focused Ion Beam. GETec will be presenting the AFSEM® and the unique benefits it can provide for your FIB system. Please visit us at our booth and learn more about [...]

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