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AFSEM® — AFM in-situ SEM

Two microscopes are better than one

GETec Microscopy offers innovative Atomic Force Microscopy solutions for seamless integration into existing host systems like Scanning Electron Microscopes. In partnership with our customers, we develop dedicated nano analysis tools based on pre-engineered modules.

AFSEM® is an AFM by GETec Microscopy, designed for integration into an SEM or Dualbeam (SEM/FIB) microscope. It’s open access design allows to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The complimentary image data of AFM and SEM enable unique characterization of your sample.

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Latest News

2018, June 11-13: HeFIB confernece in Dresden, Germany

Since two of its main focuses are on Helium Ion Microscopy and correlative nanoanalytics, GETec will be presenting its ground-breaking, in-situ AFM solution for the Zeiss ORION Nanofab. It enables interactive correlative analysis of your sample within the ORION Nanofab, without limiting the other tools of the microscope, since it can be adjusted to your specific helium ion microscope and [...]

2018, April 26: Opening of the CD laboratory in Graz

The Christian Doppler laboratory for direct fabrication of 3D nano probes explores a new type of 3D nanoprinting technology. The goal of this research programme is to enable new applications in the field of in-situ atomic force microscopy. GETec Microscopy acts as an industrial partner and will use the anticipated 3D nano probes to further improve their in-situ AFM systems.

2018, March 11-16: DPG Spring Meeting

Chris Schwalb will be giving a talk on March 14th at the annual meeting of the DPG (Deutsche Physikalische Gesellschaft). In his presentation he will mainly focus on correlative in-situ characterization of 3D nanostructures by combining SEM and AFM. Furthermore GETec Microscopy will also be present at the accompanying exhibition. Feel free to visit us there to learn more about [...]

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