Home2019-08-14T13:52:18+00:00

AFSEM® — AFM in-situ SEM

Two microscopes are better than one

GETec Microscopy offers innovative Atomic Force Microscopy solutions for seamless integration into existing host systems like Scanning Electron Microscopes. In partnership with our customers, we develop dedicated nano analysis tools based on pre-engineered modules.

AFSEM® is an AFM by GETec Microscopy, designed for integration into an SEM or Dualbeam (SEM/FIB) microscope. It’s open access design allows to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The complimentary image data of AFM and SEM enable unique characterization of your sample.

Learn more about AFSEM®

What is your Application?

AFSEM® in Action

See all

Latest News

2019 July, 1-3: 20th Conference on Solid State Analysis in Vienna

Meet GETec at the 20th Conference on Solid State Analysis in Vienna next week! This year's special focus will be on "New Surfaces and Functional Layers – Functionalizing and Analyzing". On tuesday at 11:35 GETec's Chris Schwalb will be giving a presentation on In-Situ Correlative AFM/SEM/FIB analysis of FIB-treated samples. Furthermore, we would be happy to welcome you at our [...]

2019, May 6th-7th: FIB SEM user group meeting at Washington, D.C.

GETec will be present at the FIB SEM User Group Meeting 2019 between the 6th and 7th of May at George Washington University in Washington, DC. On May 7th at 9:15 am GETec's Chris Schwalb will be giving a presentation on In-Situ Correlative AFM/SEM/FIB analysis of ion-beam treated samples. Please visit us at the Quantum Design booth to talk more [...]

More

Contact

Get in touch