Analyze magnetic properties of your sample with nanometer resolution using AFSEM®
Magnetic „super-tip” fabricated by 3D nanoprinting for high resolution MFM imaging.
Topography and MFM measurements on a multilayer sample provided by L. Fallarino, G. Hlawacek, O. Hellwig (HZDR, Germany).(a) SEM guidance allows to find the region of interest. (b) AFM topography image of a smaller area and (c) the corresponding MFM signal measured with magnetic „super-tip“
AFSEM®measurements of duplex steel sample provided by M. Knyazeva, J. Rozo Vasquez, F. Walther (TU Dortmund University). (a) SEM
guidance allows the positioning of the cantilever on the region of interest. (b) SEM image with increased contrast
shows ferromagnetic and paramagnetic phases. (c) Topography and (d) MFM signal.
- Fast and easy identification of your region of interest
- Correlative in-situ SEM & AFM analysis combined with
- Magnetic “super-tip” allows high resolution topography and