Since two of its main focuses are on Helium Ion Microscopy and correlative nanoanalytics, GETec will be presenting its ground-breaking, in-situ AFM solution for the Zeiss ORION Nanofab.
It enables interactive correlative analysis of your sample within the ORION Nanofab, without limiting the other tools of the microscope, since it can be adjusted to your specific helium ion microscope and application.
Meet us there and let’s discuss your application!
