News

2019 June 18th: AFM in-situ SEM seminar Leatherhead, Surrey

Our partner Quantum Design UK and Ireland is hosting an AFM in-situ SEM seminar in Leatherhead, Surrey. GETec’s Ernest Fantner will be present to tell you more about our AFSEM, its unique applications and what it is that makes it stand out from the rest.

Furthermore, a live demo will take place, for you to see our product in action and its high ease of use.

Please register for the seminar via this link….

 

2019-06-05T14:09:51+00:00June 5th, 2019|

2019 June 12th-14th: 3rd EuFN Workshop in Dresden

Meet GETec at the 3rd Workshop of the European FIB Network in Dresden.

Chris Schwalb and Stefan Hummel will be giving a presentation on in-situ correlative analysis of FIB-treated samples. Furthermore, feel more than free to ask any questions you might have regarding this novel analysis method and tool.

 

2019-06-05T13:51:47+00:00June 5th, 2019|

2019, May 6th-7th: FIB SEM user group meeting at Washington, D.C.

GETec will be present at the FIB SEM User Group Meeting 2019 between the 6th and 7th of May at George Washington University in Washington, DC. On May 7th at 9:15 am GETec’s Chris Schwalb will be giving a presentation on In-Situ Correlative AFM/SEM/FIB analysis of ion-beam treated samples. Please visit us at the Quantum Design booth to talk more in depth about AFSEM and how it can benefit your application!

Find out more…

2019-04-30T12:40:53+00:00April 30th, 2019|

2019, April 25th-26th: ASEM workshop in Graz, Austria

Meet GETec at the ASEM workshop.
GETec’s Chris Schwalb will be giving a talk on April 26th at 10am. The presentation wil be focusing on the topic of correlative in-situ analysis by combination of AFM, SEM and FIB.
Furthermore we would be happy to use this opportunity to discuss with you, how such an analysis can benefit your application.

Find out more…

2019-04-30T12:41:20+00:00April 15th, 2019|

2019, March: Article in Spectrum Magazine

Spectrum, a specialist journal published by Quantum Design LOT Germany featured AFSEM® in the march issue.

The second article in this series focuses on the use of AFSEM® for high resolution conductivity measurements.

Until now, the limiting factor for this standard AFM measurement modes, has been the larger radius of the specially coated, conductive cantilever tips compared with normal, uncoated tips.

We have taken a new path by using self-sensing and conductive cantilevers which feature a different design.

 

Read Article (german version)

Read Article (english version)

2019-05-13T10:02:20+00:00February 28th, 2019|

2019, Feb.: 1st AFSEM® application video

Have you seen our first AFSEM® application video? In it we analyse a specific bone structure, called lacunae, and show you how this experiment benefits from the unique properties of AFSEM®.

2019-02-14T08:38:51+00:00February 4th, 2019|

2018, October 10-12: 4th International CISCEM in Saarbrücken, Germany

Meet GETec at the Conference on In-situ and Correlative Electron Microscopy.

On wednesday Chris Schwalb will be giving a talk about interactive correlative in-situ analysis on the nanoscale by combination of AFM and SEM.

Meet us there and let’s discuss your application!

2019-02-14T08:40:20+00:00November 27th, 2018|