Spectrum, a specialist journal published by Quantum Design LOT Germany featured AFSEM® in the march issue.
The second article in this series focuses on the use of AFSEM® for high resolution conductivity measurements.
Until now, the limiting factor for this standard AFM measurement modes, has been the larger radius of the specially coated, conductive cantilever tips compared with normal, uncoated tips.
We have taken a new path by using self-sensing and conductive cantilevers which feature a different design.
