2018, October 10-12: 4th International CISCEM in Saarbrücken, Germany


Meet GETec at the Conference on In-situ and Correlative Electron Microscopy.

On wednesday Mr. Chris Schwalb will be giving a talk about interactive correlative in-situ analysis on the nanoscale by combination of AFM and SEM.


Meet us there and let’s discuss your application!

Find out more...


2018, October 3-5: 26th International Conference on Materials and Technology in Portorož, SI



With AFSEM™, SEM and AFM can be combined to conduct a correlative, in situ analysis of a variety of different materials.

Visit us at our booth to find out how it can benefit your application.

Find out more...


2018, September: Article in Spectrum Magazine

The AFSEM™ was featured in the september issue of Spectrum, a specialist journal published by Quantum Design LOT Germany.

The first article in this series introduces AFSEM™ and gives a short overview of a selection of applications.


Go to article...


2018, August 5-9: Microscopy & Microanalysis Meeting in Baltimore



GETec will be presenting various posters, which take a closer look at novel experiments, that can be conducted using the AFSEM™.

Furthermore we will be present at the booth of Quantum Design and would be happy to discuss with you, how AFSEM can benefit your application.


Find out more...


2018, July 10-13: 7th International FEBIP Workshop



The 7th International Workshop on Focused Electron Beam-Induced Processing, will be held in Modena (Italy) from 10 to 13 of July 2018.


GETec is proud to be a gold sponsor at the FEBIP workshop in Modena.

Mr. Chris Schwalb will give a presentation on July 11th highlighting the AFSEM benefits for applications in the field of focused electron beam-induced processing.


Let us meet you at our booth and discuss your application!


Find out more...



2018, June 19-20: 2nd EuFN Workshop in Grenoble, France

This event is organized by the European FIB network and is expecting participants from all over Europe. It is an opportunity to share knowledge and experience in the field of Focused Ion Beam.  


GETec will be presenting the AFSEM™ and the unique benefits it can provide for your FIB system. Please visit us at our booth and learn more about our product!


Find out more about this event….



2018, June 11-13: HeFIB conference in Dresden, Germany

Since two of its main focuses are on Helium Ion Microscopy and correlative nanoanalytics, GETec will be presenting its ground-breaking, in-situ AFM solution for the Zeiss ORION Nanofab.  

It enables interactive correlative analysis of your sample within the ORION Nanofab, without limiting the other tools of the microscope, since it can be adjusted to your specific helium ion microscope and application.


Meet us there and let’s discuss your application!


Find out more...



2018-April-26: Opening of the CD laboratory in Graz


The Christian Doppler laboratory for direct fabrication of 3D nano probes explores a new type of 3D nanoprinting technology. The goal of this research programme is to enable new applications in the field of in-situ atomic force microscopy.


GETec Microscopy acts as an industrial partner and will use the anticipated 3D nano probes to further improve their in-situ AFM systems.



2018, March 11-16: DPG Spring Meeting

Mr. Chris Schwalb will be giving a talk on March 14th at the annual meeting of the DPG (Deutsche Physikalische Gesellschaft). In his presentation he will mainly focus on correlative in-situ characterization of 3D nanostructures by combining SEM and AFM.


Furthermore GETec Microscopy will also be present at the accompanying exhibition. Feel free to visit us there to learn more about GETec Microscopy and AFSEMTM. You can find us at the booth of LOT-QuantumDesign.



2018-Feb.: Interview with Proactive Investors

Mr. Stefan Hummel was interviewed at the GrapheneForUS confernece in New York. Watch the interview below.

2018, Feb. 22-23: GrapheneForUS conference

For the first time the international conference for graphene and 2D materials will take place between the 22nd and 23rd of February. New York will host the event focusing on the exchange and exploration of graphene-related developments in science and its commercial use.

Mr. Stefan Hummel will be representing GETec and giving a talk on the second day of the conference.




2017-Nov.-27: Exhibition at the MRS in Boston

GETec Microscopy presented the leading solution for correlative in-situ AFM & SEM analysis (AFSEM) together with Quantum Design Inc. at the MRS fall meeting in Boston.

Photo of the exhibition booth




ELAMB_2017, Comenius University, Bratislava, SlovakiaAFSEM™ air was used to characterize a novel cell preparation method by two students Clemens Kemptner and Sarah Steiner. The students work at the Johannes Kepler University Linz, Institute of Biophysics in the working group of Prof. Andreas Ebner.
We are very proud to announce Mr. Kemptner and his work was awarded with a poster prize for PhD students and young researchers within the framework of the International School for "Electrochemical and acoustic methods in bioanalysis" (ELAMB 2017).

poster as PDF


2017-August: Poster at the Microscopy&Microanalysis Meeting

At the Microanalysis and Microscopy Meeting in St.Louis, Missouri, a new poster focusing on the improved understanding of material behavior using our AFSEMTM was presented.


Poster as PDF...



A new poster about "Correlative in-situ AFM & SEM & EDX & EBSD analysis of nanostructured materials" by using our GETec microscopy's AFSEM™ was presented at the Microscopy Conference 2017 in Lausanne, Switzerland


poster as PDF


2017-July-6: GETec Micr. presented AFSEM at Microscience Microscopy Congress (MMC) Manchester

GETec Microscopy presented AFSEMTM at the Microscience Microscopy Congress (MMC) exhibition in Manchester, UK. We showed the first steps to perform correlative AFM/SEM microscopy by combining SEM imaging with 3D topography by AFM. This is exemplified by studying collagen fibers of a cow bone. While the SEM is used to guide the the cantilever to the region of interest on the bone structure, the AFSEMTM is employed for the 3D analysis of the collagen fibers. In a next step we present the crossover from correlative microscopy to real in-situ correlative analysis by combining AFM measurements with chemical and crystallopraphic anaylsis using EDS and EBSD.


mmc2017 logo



The growing importance of FIB-based processing during the last decade is highlighted by the first workshop of the “European Ion Beam Network” following 11 successful years of the “D-A-CH FIB Arbeitskreis”. As Platinum sponsor, GETec Microscopy has proudly presented the AFSEM™ as a powerful tool for in-situ correlative SEM/FIB/AFM analysis. At our booth we presented applications and scientifically benefit from the new correlative analysis capabilities in your dual beam system.


2017-May-19: AFSEM Poster at ISPM 2017 in Kyoto

GETec Microscopy has presented a new poster at the ISPM 2017 in Kyoto. Poster title: "In-situ, correlative atomic force and scanning electron microscopy". It describes seamless combination of AFM and SEM  by using self-sensing cantilever technology from SCL-Sensor.Tech. Fabrication. Two applications 1) Electrical and elemental characterization and 2) In-situ mechanical analysis demonstrate the power of the AFSEMTM.


download poster as PDF


2017-May-17: Latest publication in Review of Scientific Instruments

A new AFSEMTM paper (A versatile atomic force microscope integrated with a scanning electron microscope by J. Kreith et al. was published)


see GETec publications


GETec Microscopy sponsored the 2nd Slovenian microscopy society symposium in Piran. Interesting AFSEMTM opportunities were discussed with microscope users, material and life‐science scientists.


booth image 1




Image: AFSEM and tensile stageA scanning electron microscope (SEM) is a powerful tool to study the surface changes and fracture mechanics of tensile stress samples. However, quantitative height information and crack/roughness analysis with sub-nanometer resolution is not possible with the SEM. With AFSEM™, the strengths of SEM and AFM are easily combined with tensile stages for correlative, in-situ analysis of tensile stress samples. Read more...


Our partner Nanosurf has launched a new support web-information about the topic AFM theory (Atomic force microscopy explained). In this overview general AFM principles are described as well as operation modes illustrated with many images and examples. Improve your knowledge about AFM and open AFM theory info website...



GETec Microscopy attended the 7th ASEM workshop in Vienna as a silver sponsor to promote its AFSEMTM. A field report of a scientific partner was proudly presented, and important contacts were successfully established.


Download ASEM booklet entry from GETec: Direct-Write Fabrication of Electric and Thermal High-Resolution Nanoprobes on Self-Sensing AFM Cantilever


booth image 1, booth image2



Enjoy the 1st AFSEMTM webinar and learn more about the leading solution for in-situ correlative AFM-SEM-EDX analysis. AFSEM uses self-sensing cantilevers from SCL-Sensor.Tech.

More details about the webinar...


2017-March-03: Getec Nomination for Houska Award 2017

Houska Preis AwardGETec Microscopy was nominated for the Houska Award 2017 for its project "Triple Scanning Microscopy with sub-nm resolution". This award is dedicated to Austrian research in universities and SME organisations.


For the first time, the Triple-S microscope offers the opportunity to combine separate microscopy methods in one system. The sub-nanometer-resolution triple scanning microscope enables high-precision measurement of wide variety of sample properties. For example electric, magnetic, thermal and mechanical sample properties can be measured. The system is primarily used for research in materials science, the energy sector and for damage analysis.

see local newspaper article PDF


2017-Feb-10: GETec installs the AFSEM™ in EPFL's clean-room facility

GETec proudly announces that the École polytechnique fédérale de Lausanne (EPFL) from now on uses the AFSEM™ in their dual-beam FEI Nova 600 system. In one of the most advanced clean-room facilities world-wide, the AFSEM™ will demonstrate the capabilities of correlative analysis at the leading edge of science and technology.




2016-Nov-10: GETec nominated for national innovation price 2016

GETec Microscopy was nominated for the award "Niederösterreichische Innovationspreis 2016", which is a national price for innovative companies. This nomination awards GETec's driving force of innovation, increasing users benefits and high market potential of the AFSEMTM in the microscopy industry sector.


See the GETec Microscopy nomination video...


Read the award proposal...


2016-Oct-11: CISCEM 2016

The CISCEM 2016 perfectly illustrates the extraordinary possibilities of in-situ correlative microscopy. It will significantly influence the way how micro- and nanoanalysis will be performed in the future. GETec Microscopy has presented AFSEMTM on the conference.


2016-July-24...28th: M&M 2016 - Microscopy and Microanalysis - Ohio

As one of the most important conferences on scanning electron microscopy, the M&M provided the basis for the introduction of the AFSEMTM to the U.S. market. GETec Microscopy has been in close contact with major SEM manufacturers and we are looking forward to integrating the AFSEM in to many state-of-the-art SEM systems. Have a look at our booth: image

2016-July-5...8th: FEBIP 2016 - Focused Electron beam induced processing, Austria

As platinum sponsor GETec Microscopy presented the AFSEMTM at the FEBIP conference in Vienna. Along with in depth discussions with specialists in electron microscopy, all attendees had the chance to see a realized integration of the AFSEMTM into a FEI XL30 SEM and convince themselves about the AFSEMTM capabilities in the GETec exhibitor presentation. We received great feedback from all FEBIP scientists - thanks for that great conference!


2016-June-12: ISPM Symposium in Grindelwald Switzerland

GETec Microscopy presented its in-situ AFM for SEMs called AFSEMTM at the ISPM 2016 in Grindelwald, Switzerland. Many prospective customers visited the booth, had productive talks and got new information about AFSEMTM.


download poster as PDF

2016-May-03: 17th CMi Annual Review Meeting

GETec Microscopy had its first joint exhibition with Gloor instruments. Many concrete prospective customer contacts were established.

2016-March-29: MRS Spring Meeting in Phoenix

GETec Microscopy presented its AFSEMTM in Phoenix (USA) at the MRS Spring Meeting. 2016. Poster: "Examining Nanoindentation Imprints with in-situ AFM-SEM". Furthermore, scientific work results were presented by

  • Dr. Harald Plank, TU Graz (Title: "AFM Based High-Speed Tomography in Electron and Ion Beam Microscopes") and
  • Prof. Peter Hosemann, UC Berkeley (Title: "He Bubble Structure Evolution and Effect on the Mechanical Properties of Metals Studied Using Novel Microscopy Techniques").


2016-March-06: DPG-Frühjahrstagung, Regensburg, Germany

GETec Microscopy presented AFSEMTM in their first joint exhibition.


2015, Nov. 30: GETec at the MRS Fall Meeting in Boston, USA

GETec Microscopy presented the AFSEMTM at the MRS Fall Meeting exhibition in Boston (USA). In addition, Dr. Christian Schwalb presented latest results in "Correlated AFM & SEM Microscopy of Nanostructured Materials" to leading scientists in the course of the symposium "Frontiers in Scanning Probe Microscopy". read more...


The Department of Nuclear Engineering from the Berkeley University of California has installed some very exciting new equipment this month. An AFSEMTM scanner from GETec Microscopy (Austria) was installed within a SEM. The scanner uses SCL's self-sensing cantilevers with electrical readout circumventing the lack of space for optical readout within the SEM. The combination of SEM and AFM allows access to different properties at the same location of a specimen. Currently AFM topography and phase imaging is available in combination with SE and BSE detection of electrons from the SEM.


Opens external link in new windowLink Berkeley university of California

2015, Oct.: CHInano 2015

GETec Microscopy has attended the well known international fair CHInano2015. Our team presented the versatile AFSEMTM for high-tech AFM and SEM users in China. We are sure, AFSEMTM is the right solution to enable exciting new experiments for correlated microscopy applications. We are looking forward to interesting cooperations with Chinese universities and industrial enterprises.



2015, Sept. 6-11: MC-2015 Göttingen, Germany

GETec Microscopy has participated in the important international Microscopy Conference 2015 (MC2015) in Göttingen, Germany. Our team presented the very compact AFSEMTM dedicated for correlated microscopy applications within the large SEM market. We are looking forward to ambitious customers and interesting cooperations with SEM manufacturers.


GETec Microscopy has attended the international fair for manufacturing technology called "Intertool" from May 6 to 9. In cooperation with researchTUb GmbH and the “Institut für Fertigungstechnik und Hochleistungslasertechnik” (IFT) of the Vienna University of Technology GETec has presented its versatile AFSEM scanner to the interested fair visitors. The cutting edge theme of the Intertool was “Industry 4.0 - The intelligent factory of the future".


Click on the logo to see some images and a video of the Intertool 2014.

GETec's CEO Mr. Dr. Ernest J. Fantner was invited by the FFG (Forschungsförderungsgesellschaft) to present the successful international projects of the partner companies SCL and GETec in the "Haus der Forschung" (house of science), Vienna. The FFG event had the title "Von der Idee zum Markt" (from idea to market) and was restricted to an audience size of max. 110 participants.



2013, Dec: GETec moves to High-Tech center Aspern-IQ

In December 2014 the GETec headquarter moves to High-Tech center Aspern-IQ in Seestadtstrasse 27, 1220 Vienna.


2013, March: R&D projects

GETec Microscopy has started further national and international research & development projects in March 2013. One of the international project proposals has been ranked under the top 3% of all applied project proposals! These projects will significantly push the final product development and the market introduction of AFSEM.

2012, Dec 1-6: Poster presentation on MRS Fall Meeting in Boston

Many advantages arise with the combined imaging capabilities of the atomic force microscope (AFM) and the scanning electron microscope (SEM). AFSEM™ is optimized for co-localized AFM/SEM imaging for in-situ micromechanical testing and complex sample geometries. The precision cantilever positioning under SEM control is especially important for ... (MRS poster as PDF)

2012, Nov 7: International trademark registration "AFSEM"

On 2012-11-07 GETec Microscopy has registered an international trademark AFSEM (int. reg. no. 1159839) for its further business activities. AFSEM is an acronym for the combination of an AFM (atomic force microscope) and SEM (scanning electron microscope).

2011, April: Company Foundation of GETec

GETec was founded in April 2011. Core competences of GETec are the development and production of analytical equipment with main focus on AFM techniques.