Meet GETec at the ASEM workshop.
GETec’s Chris Schwalb will be giving a talk on April 26th at 10am. The presentation wil be focusing on the topic of correlative in-situ analysis by combination of AFM, SEM and FIB.
Furthermore we would be happy to use this opportunity to discuss with you, how such an analysis can benefit your application.
Meet GETec at the Fysica on April 5th in Amsterdam. Visit the LOT Quantum Design booth to find out more about our unique correlative analysis platform.
We will be more than happy to dicuss with you how it can benefit your application.
Spectrum, a specialist journal published by Quantum Design LOT Germany featured AFSEM® in the march issue.
The second article in this series focuses on the use of AFSEM® for high resolution conductivity measurements.
Until now, the limiting factor for this standard AFM measurement modes, has been the larger radius of the specially coated, conductive cantilever tips compared with normal, uncoated tips.
We have taken a new path by using self-sensing and conductive cantilevers which feature a different design.
Have you seen our first AFSEM® application video? In it we analyse a specific bone structure, called lacunae, and show you how this experiment benefits from the unique properties of AFSEM®.
Meet GETec at the Conference on In-situ and Correlative Electron Microscopy.
On wednesday Chris Schwalb will be giving a talk about interactive correlative in-situ analysis on the nanoscale by combination of AFM and SEM.
Meet us there and let’s discuss your application!
With AFSEM®, SEM and AFM can be combined to conduct a correlative, in situ analysis of a variety of different materials.
Visit us at our booth to find out how it can benefit your application.
The AFSEM® was featured in the september issue of Spectrum, a specialist journal published by Quantum Design LOT Germany.
The first article in this series introduces AFSEM® and gives a short overview of a selection of applications.
